000 04610nam a22005895i 4500
001 978-0-387-29409-4
003 DE-He213
005 20141014113429.0
007 cr nn 008mamaa
008 100301s2006 xxu| s |||| 0|eng d
020 _a9780387294094
_9978-0-387-29409-4
024 7 _a10.1007/0-387-29409-0
_2doi
041 _aeng
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
082 0 4 _a621.3815
_223
100 1 _aGizopoulos, Dimitris.
_eeditor.
245 1 0 _aGizopoulos / Advances in ElectronicTesting
_h[electronic resource] /
_cedited by Dimitris Gizopoulos.
260 1 _aBoston, MA :
_bSpringer US,
_c2006.
264 1 _aBoston, MA :
_bSpringer US,
_c2006.
300 _aXXV, 412 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aFrontiers in Electronic Testing,
_x0929-1296 ;
_v27
505 0 _aDefect-Orinted Testing -- Failure Mechanisms and Testing in Nanometer Technologies -- Silicon Debug -- Delay Testing -- High-Speed Digital Test Interfaces -- DFT_Oriented,Low-Cost Testers -- Embedded Cores and System-on-Chip Testing -- Embedded MemoryTesting -- Mixed-Signal Testing and DfT -- RF Testing -- Loaded Board Testing.
520 _aAdvances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today’s state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey. The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mexico Univ., Sandia National Labs, Synopsys, Teradyne and Texas Instruments. Advances in Electronic Testing: Challenges and Methodologies is an advanced textbook and reference point for senior undergraduate and graduate students in MSc or PhD tracks, professors and research leaders in the electronic testing domain. It is also for industry design and test engineers and managers seeking a global view and understanding of test technology practices and methodologies and a dense elaboration on test-related issues they face in their development projects. "There is a definite need for documenting the advances in testing … I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. […] the book provides, besides novel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. […] This latest addition to the Frontiers Series is destined to serve an important role." From the Foreword by Vishwani D. Agrawal, Consulting Editor, Frontiers in Electronic Testing Book Series.
650 0 _aEngineering.
650 0 _aOperating systems (Computers).
650 0 _aEngineering design.
650 0 _aComputer engineering.
650 0 _aElectronics.
650 0 _aSystems engineering.
650 0 _aOptical materials.
650 1 4 _aEngineering.
650 2 4 _aCircuits and Systems.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
650 2 4 _aEngineering Design.
650 2 4 _aOptical and Electronic Materials.
650 2 4 _aElectrical Engineering.
650 2 4 _aPerformance and Reliability.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9780387294087
830 0 _aFrontiers in Electronic Testing,
_x0929-1296 ;
_v27
856 4 0 _uhttp://dx.doi.org/10.1007/0-387-29409-0
912 _aZDB-2-ENG
942 _cEB
999 _c611
_d611