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1.
Distributed Large-Scale Dimensional Metrology [electronic resource] : New Insights / by Fiorenzo Franceschini, Maurizio Galetto, Domenico Maisano, Luca Mastrogiacomo, Barbara Pralio.

by Franceschini, Fiorenzo [author.] | Galetto, Maurizio [author.] | Maisano, Domenico [author.] | Mastrogiacomo, Luca [author.] | Pralio, Barbara [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: London : Springer London, 2011Online access: Click here to access online Availability: No items available :

2.
On-Chip Instrumentation [electronic resource] : Design and Debug for Systems on Chip / by Neal Stollon.

by Stollon, Neal [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Boston, MA : Springer US, 2011Online access: Click here to access online Availability: No items available :

3.
Information Modeling for Interoperable Dimensional Metrology [electronic resource] / by Yaoyao (Fiona) Zhao, Robert Brown, Thomas R. Kramer, Xun Xu.

by Zhao, Yaoyao (Fiona) [author.] | Brown, Robert [author.] | Kramer, Thomas R [author.] | Xu, Xun [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: London : Springer London, 2011Online access: Click here to access online Availability: No items available :


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