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1.
Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings / edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick Ridder.

by Yeung, Dit-Yan [editor.] | Kwok, James T [editor.] | Fred, Ana [editor.] | Roli, Fabio [editor.] | Ridder, Dick [editor.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006Online access: Click here to access online Availability: No items available :

2.
Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshop, SSPR & SPR 2008, Orlando, USA, December 4-6, 2008. Proceedings / edited by Niels Vitoria Lobo, Takis Kasparis, Fabio Roli, James T. Kwok, Michael Georgiopoulos, Georgios C. Anagnostopoulos, Marco Loog.

by Vitoria Lobo, Niels [editor.] | Kasparis, Takis [editor.] | Roli, Fabio [editor.] | Kwok, James T [editor.] | Georgiopoulos, Michael [editor.] | Anagnostopoulos, Georgios C [editor.] | Loog, Marco [editor.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008Online access: Click here to access online Availability: No items available :


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