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1.
Introduction to Advanced System-on-Chip Test Design and Optimization [electronic resource] / by Erik Larsson.

by Larsson, Erik [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Boston, MA : Springer US, 2005Online access: Click here to access online Availability: No items available :

2.
Fault Diagnosis of Analog Integrated Circuits [electronic resource] / by Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha.

by Kabisatpathy, Prithviraj [author.] | Barua, Alok [author.] | Sinha, Satyabroto [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Boston, MA : Springer US, 2005Online access: Click here to access online Availability: No items available :

3.
Gizopoulos / Advances in ElectronicTesting [electronic resource] / edited by Dimitris Gizopoulos.

by Gizopoulos, Dimitris [editor.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Boston, MA : Springer US, 2006Online access: Click here to access online Availability: No items available :

4.
Digital Timing Measurements [electronic resource] : From Scopes and Probes to Timing and Jitter / by Wolfgang Maichen.

by Maichen, Wolfgang [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Boston, MA : Springer US, 2006Online access: Click here to access online Availability: No items available :

5.
The Core Test Wrapper Handbook [electronic resource] : Rationale and Application of IEEE Std. 1500™ / by Francisco Silva, Teresa McLaurin, Tom Waayers.

by Silva, Francisco [author.] | McLaurin, Teresa [author.] | Waayers, Tom [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Boston, MA : Springer US, 2006Online access: Click here to access online Availability: No items available :

6.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, José Pineda de Gyvez.

by Sachdev, Manoj [editor.] | Gyvez, José Pineda de [editor.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Boston, MA : Springer US, 2007Online access: Click here to access online Availability: No items available :

7.
Emerging Nanotechnologies [electronic resource] : Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor.

by Tehranipoor, Mohammad [editor.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Boston, MA : Springer US, 2008Online access: Click here to access online Availability: No items available :

8.
Oscillation-Based Test in Mixed-Signal Circuits [electronic resource] / by Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz.

by Sánchez, Gloria Huertas [author.] | García de la Vega, Diego Vázquez [author.] | Rueda, Adoración Rueda [author.] | Díaz, José Luis Huertas [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Dordrecht : Springer Netherlands, 2006Online access: Click here to access online Availability: No items available :

9.
Soft Errors in Modern Electronic Systems [electronic resource] / edited by Michael Nicolaidis.

by Nicolaidis, Michael [editor.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Boston, MA : Springer US : Imprint: Springer, 2011Online access: Click here to access online Availability: No items available :


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