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1.
Leakage in Nanometer CMOS Technologies [electronic resource] / by Siva G. Narendra, Anantha Chandrakasan.

by Narendra, Siva G [author.] | Chandrakasan, Anantha [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Boston, MA : Springer US, 2006Online access: Click here to access online Availability: No items available :

2.
Thermal and Power Management of Integrated Circuits [electronic resource] / by Arman Vassighi, Manoj Sachdev.

by Vassighi, Arman [author.] | Sachdev, Manoj [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Boston, MA : Springer US, 2006Online access: Click here to access online Availability: No items available :

3.
Abstraction Refinement for Large Scale Model Checking [electronic resource] / by Chao Wang, Gary D. Hachtel, Fabio Somenzi.

by Wang, Chao [author.] | Hachtel, Gary D [author.] | Somenzi, Fabio [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Boston, MA : Springer US, 2006Online access: Click here to access online Availability: No items available :

4.
A Practical Introduction to PSL [electronic resource] / by Cindy Eisner, Dana Fisman.

by Eisner, Cindy [author.] | Fisman, Dana [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Boston, MA : Springer US, 2006Online access: Click here to access online Availability: No items available :

5.
Routing Congestion in VLSI Circuits: Estimation and Optimization [electronic resource] / by Prashant Saxena, Rupesh S. Shelar, Sachin S. Sapatnekar.

by Saxena, Prashant [author.] | Shelar, Rupesh S [author.] | Sapatnekar, Sachin S [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Boston, MA : Springer US, 2007Online access: Click here to access online Availability: No items available :

6.
Design for Manufacturability and Yield for Nano-Scale CMOS [electronic resource] / by Charles C. Chiang, Jamil Kawa.

by Chiang, Charles C [author.] | Kawa, Jamil [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Dordrecht : Springer Netherlands, 2007Online access: Click here to access online Availability: No items available :

7.
Routing congestion in vlsi circuits: estimation and optimization

by Saxena, Prashant.

Material type: Text Text; Format: print Language: English Publisher: New york : Springer, 2007Availability: Items available for loan: Call number: 621.395 SAX/R (1).

8.
Design for manufacturability and statistical design: a constructive approach

by Orshansky, Michael.

Material type: Text Text; Format: print Language: English Publisher: New york : Springer, 2008Availability: Items available for loan: Call number: 621.3815 ORS/D (1).

9.
Design for manufacturability and yield for nano-scale cmos

by Chiang, Charlse C.

Material type: Text Text; Format: print Language: English Publisher: Dordrecht : Springer, 2007Availability: Items available for loan: Call number: 621.3815 CHI/D (1).


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