Distributed Large-Scale Dimensional Metrology [electronic resource] : New Insights / by Fiorenzo Franceschini, Maurizio Galetto, Domenico Maisano, Luca Mastrogiacomo, Barbara Pralio.Material type: TextLanguage: English Publisher: London : Springer London, 2011Description: XVI, 233 p. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9780857295439Subject(s): Engineering | Computer aided design | Machinery | Engineering | Manufacturing, Machines, Tools | Measurement Science and Instrumentation | Mathematical Modeling and Industrial Mathematics | Computer-Aided Engineering (CAD, CAE) and DesignAdditional physical formats: Printed edition:: No titleDDC classification: 670 LOC classification: TJ241Online resources: Click here to access online
1. LSM: The New Paradigm of Distributed Systems -- 2. Indoor GPS (iGPSTM) -- 3. The Mobile Spatial coordinate Measuring System (MScMS) -- 4. Positioning and Coverage of Distributed Devices -- 5. System Calibration -- 6. Self-Diagnostic Tools -- 7. Methodologies for Performance Enhancing -- 8. Evaluation of Measurement Uncertainty.
The field of large-scale dimensional metrology (LSM) deals with objects that have linear dimensions ranging from tens to hundreds of meters. It has recently attracted a great deal of interest in many areas of production, including the automotive, railway, and shipbuilding sectors. Distributed Large-Scale Dimensional Metrology introduces a new paradigm in this field that reverses the classical metrological approach: measuring systems that are portable and can be easily moved around the location of the measured object, which is preferable to moving the object itself. Distributed Large-Scale Dimensional Metrology combines the concepts of distributed systems and large-scale metrology at the application level. It focuses on the latest insights and challenges of this new generation of systems from the perspective of the designers and developers. The main topics are: coverage of measuring area, sensors calibration, on-line diagnostics, probe management, and analysis of metrological performance. The general descriptions of each topic are further enriched by specific examples concerning the use of commercially available systems or the development of new prototypes. This will be particularly useful for professional practitioners such as quality engineers, manufacturing and development engineers, and procurement specialists, but Distributed Large-Scale Dimensional Metrology also has a wealth of information for interested academics.