Digital Timing Measurements [electronic resource] : From Scopes and Probes to Timing and Jitter / by Wolfgang Maichen.Material type: TextLanguage: English Series: Frontiers in Electronic Testing: 33Publisher: Boston, MA : Springer US, 2006Description: XIII, 240 p. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9780387314198Subject(s): Engineering | Engineering design | Microwaves | Electronics | Systems engineering | Engineering | Circuits and Systems | Electronic and Computer Engineering | Engineering Design | Electronics and Microelectronics, Instrumentation | Signal, Image and Speech Processing | Microwaves, RF and Optical EngineeringAdditional physical formats: Printed edition:: No titleDDC classification: 621.3815 LOC classification: TK7888.4Online resources: Click here to access online
Chapter I: Electrical Basics. 1. Time domain and frequency domain. 2. Transmission line theory -- Chapter II: Measurement Hardware. 1. Oscilloscopes and CO. 2. Key instrument parameters. 3. Probes. 4. Accessories -- Chapter III: Timing and Jitter. 1. Statistical basics. 2. Rise time measurements. 3. Understanding jitter. 4. Jitter Analysis -- Chapter IV: Measurement Accuracy. 1. Specialized Measurement Techniques. 2. Digital Signal Processing -- References -- Index.
As many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, and application of electronic circuits. To be successful in this endeavour, an engineer needs a knowledge base covering instrumentation, measurement techniques, signal integrity, jitter and timing concepts, and statistics. Very often even the most experienced digital test engineers, while mastering some of those subjects, lack systematic knowledge or experience in the high speed signal area. Digital Timing Measurements gives a compact, practice-oriented overview on all those subjects. The emphasis is on useable concepts and real-life guidelines that can be readily put into practice, with references to the underlying mathematical theory. It unites in one place a variety of information relevant to high speed testing, measurement, signal fidelity, and instrumentation.