Physical principles of electron microscopy: an introduction to tem, sem and aem

By: Egerton, Ray FMaterial type: TextTextLanguage: English Publisher: New york : Springer, 2005Description: 202ISBN: 9780387258003Subject(s): Electron microscopy | Microscopy | Materials | Nanotechnology | Chemistry | Surfaces (Physics) | Electromagnetism | Materials scienceDDC classification: 502.825
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Item type Current location Call number Status Date due Barcode
General/Text Books General/Text Books BP Central Library
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502.825 EGE/P (Browse shelf) Available 51082
General/Text Books General/Text Books BP Central Library
General Section
502 EGE/P (Browse shelf) Available 63606

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