Scanning electron microscopy and x-ray microanalysis

By: Goldstein, JosephMaterial type: TextTextLanguage: English Publisher: New york : Kluwer academic, 2003Edition: 3rdDescription: 689 pISBN: 306472929Subject(s): X-ray microanalysis | Scanning electron microscopy | Surfaces (Physics) | Microscopy | Nanotechnology | Developmental biology | GeographyDDC classification: 502.825
List(s) this item appears in: List of CDs Available with Books
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502.825 GOL/S (Browse shelf) Not for loan 50723

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