Low-Frequency Noise In Advanced Mos Devices [electronic resource] / by Martin von Haartman, Mikael Östling.

By: Haartman, Martin von [author.]Contributor(s): Östling, Mikael [author.] | SpringerLink (Online service)Material type: TextTextLanguage: English Series: Analog Circuits and Signal Processing Series: Publisher: Dordrecht : Springer Netherlands, 2007Description: XVI, 216 p. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9781402059100Subject(s): Engineering | Microwaves | Electronics | Systems engineering | Engineering | Electronics and Microelectronics, Instrumentation | Circuits and Systems | Physics and Applied Physics in Engineering | Microwaves, RF and Optical EngineeringAdditional physical formats: Printed edition:: No titleDDC classification: 621.381 LOC classification: TK7800-8360TK7874-7874.9Online resources: Click here to access online In: Springer eBooksSummary: Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-frequency (1/f) noise models in MOS transistors are treated extensively providing an in-depth understanding of the low-frequency noise mechanisms and the potential sources of the noise in MOS transistors. Advanced CMOS technology including nanometer scaled devices, strained Si, SiGe, SOI, high-k gate dielectrics, multiple gates and metal gates are discussed from a low-frequency noise point of view. Some of the most recent publications and conference presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits.
Tags from this library: No tags from this library for this title. Log in to add tags.
    Average rating: 0.0 (0 votes)
No physical items for this record

Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-frequency (1/f) noise models in MOS transistors are treated extensively providing an in-depth understanding of the low-frequency noise mechanisms and the potential sources of the noise in MOS transistors. Advanced CMOS technology including nanometer scaled devices, strained Si, SiGe, SOI, high-k gate dielectrics, multiple gates and metal gates are discussed from a low-frequency noise point of view. Some of the most recent publications and conference presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits.

There are no comments on this title.

to post a comment.

Implemented and Maintained by Biju Patnaik Central Library.
For any Suggestions/Query Contact to library or Email: library@nitrkl.ac.in OR bpcl-cir@nitrkl.ac.in. Ph:91+6612462103
Website/OPAC best viewed in Mozilla Browser in 1366X768 Resolution.

Powered by Koha