Radiation Effects on Embedded Systems [electronic resource] / edited by RAOUL VELAZCO, PASCAL FOUILLAT, RICARDO REIS.

By: VELAZCO, RAOUL [editor.]Contributor(s): FOUILLAT, PASCAL [editor.] | REIS, RICARDO [editor.] | SpringerLink (Online service)Material type: TextTextLanguage: English Publisher: Dordrecht : Springer Netherlands, 2007Description: VIII, 269 p. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9781402056468Subject(s): Engineering | Electronics | Systems engineering | Nuclear engineering | Environmental protection | Engineering | Circuits and Systems | Effects of Radiation/Radiation Protection | Electronic and Computer Engineering | Electronics and Microelectronics, Instrumentation | Nuclear EngineeringAdditional physical formats: Printed edition:: No titleDDC classification: 621.3815 LOC classification: TK7888.4Online resources: Click here to access online
Contents:
Radiation Space Environment -- Radiation Effects in Microelectronics -- In-flight Anomalies on Electronic Devices -- Multi-level Fault Effects Evaluation -- Effects of Radiation on Analog and Mixed-Signal Circuits -- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing -- Design Hardening Methodologies for ASICs -- Fault Tolerance in Programmable Circuits -- Automatic Tools for Design Hardening -- Test Facilities for SEE and Dose Testing -- Error Rate Prediction of Digital Architectures: Test Methodology and Tools -- Using the SEEM Software for Laser SET Testing and Analysis.
In: Springer eBooksSummary: Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005. This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.
Tags from this library: No tags from this library for this title. Log in to add tags.
    Average rating: 0.0 (0 votes)
No physical items for this record

Radiation Space Environment -- Radiation Effects in Microelectronics -- In-flight Anomalies on Electronic Devices -- Multi-level Fault Effects Evaluation -- Effects of Radiation on Analog and Mixed-Signal Circuits -- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing -- Design Hardening Methodologies for ASICs -- Fault Tolerance in Programmable Circuits -- Automatic Tools for Design Hardening -- Test Facilities for SEE and Dose Testing -- Error Rate Prediction of Digital Architectures: Test Methodology and Tools -- Using the SEEM Software for Laser SET Testing and Analysis.

Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005. This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.

There are no comments on this title.

to post a comment.

Implemented and Maintained by Biju Patnaik Central Library.
For any Suggestions/Query Contact to library or Email: library@nitrkl.ac.in OR bpcl-cir@nitrkl.ac.in. Ph:91+6612462103
Website/OPAC best viewed in Mozilla Browser in 1366X768 Resolution.

Powered by Koha