Atomic force microscopy in process engineering (Record no. 53)

000 -LEADER
fixed length control field 04630cam a2200637Ia 4500
001 - CONTROL NUMBER
control field ocn488709610
003 - CONTROL NUMBER IDENTIFIER
control field OCoLC
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140426153705.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS--GENERAL INFORMATION
fixed length control field m o d
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr cn|
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 091214s2009 enka ob 001 0 eng d
040 ## - CATALOGING SOURCE
Original cataloging agency KNOVL
Language of cataloging eng
Transcribing agency KNOVL
Modifying agency EBLCP
-- BTCTA
-- IDEBK
-- OCLCQ
-- OPELS
-- N$T
-- WCM
-- CDX
-- OCLCQ
-- KNOVL
-- ZCU
019 ## -
-- 311788083
-- 429897934
-- 503828535
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780080949574 (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0080949576 (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781856175173 (Cloth)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 1856175170 (Cloth)
029 1# - (OCLC)
OCLC library identifier NZ1
System control number 13225700
029 1# - (OCLC)
OCLC library identifier AU@
System control number 000045829337
029 1# - (OCLC)
OCLC library identifier DEBBG
System control number BV039828323
029 1# - (OCLC)
OCLC library identifier CDX
System control number 10799380
029 1# - (OCLC)
OCLC library identifier NZ1
System control number 13247795
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)488709610
Canceled/invalid control number (OCoLC)311788083
-- (OCoLC)429897934
-- (OCoLC)503828535
037 ## - SOURCE OF ACQUISITION
Source of stock number/acquisition Knovel Corporation
Note http://www.knovel.com
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QH212.A78
Item number A86 2009eb
070 ## - NATIONAL AGRICULTURAL LIBRARY CALL NUMBER
Classification number QH212.A78
Item number A86 2009
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC
Subject category code subdivision 027000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 660
Edition number 22
049 ## - LOCAL HOLDINGS (OCLC)
Holding library NTRA
245 00 - TITLE STATEMENT
Title Atomic force microscopy in process engineering
Medium [electronic resource] :
Remainder of title introduction to AFM for improved processes and products /
Statement of responsibility, etc [edited by] W. Richard Bowen and Nidal Hilal.
250 ## - EDITION STATEMENT
Edition statement 1st ed.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc Oxford ;
-- Burlington, MA :
Name of publisher, distributor, etc Butterworth-Heinemann,
Date of publication, distribution, etc c2009.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource (xvi, 283 p.) :
Other physical details ill.
490 1# - SERIES STATEMENT
Series statement Butterworth-Heinemann/IChemE series
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographical references and index.
588 ## -
-- Description based on print version record.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note BASIC PRINCIPLES OF ATOMIC FORCE MICROSCOPY / W Richard Bowen, Nidal Hilal and Daniel Johnson -- CHARACTERISATION OF MEMBRANE SURFACES / W Richard Bowen, Nidal Hilal and Teodora Doneva -- AFM AND DEVELOPMENT OF (BIO)FOULING RESISTANT MEMBRANES / W Richard Bowen, Nidal Hilal, Huabing Yin and Laila Al-Khatib -- APPLICATION OF ATOMIC FORCE MICROSCOPY TO PARTICLE-PARTICLE INTERACTIONS / Nidal Hilal, Yuncheng Liang and Daniel Johnson -- QUANTIFICATION OF PARTICLE-BUBBLE INTERACTIONS / Nidal Hilal and Daniel Johnson -- NANOSCALE ANALYSIS OF PHARMACEUTICALS BY SCANNING PROBE MICROSCOPY / Clive J Roberts -- THE APPLICATION OF AFM WITHIN BIOPROCESS ENGINEERING / Chris J Wright -- THE APPLICATION OF AFM TO THE DEVELOPMENT OF PROCESS PLANT MATERIALS / Chris J Wright -- ATOMIC FORCE MICROSCOPY AND POLYMERS ON SURFACES / Vasileios Koutsos -- AFM-BASED MICRO/NANO-RHEOMETRY / Matthew S Barrow and P Rhodri Williams -- CONCLUSIONS AND FUTURE OUTLOOK / W Richard Bowen and Nidal Hilal.
520 ## - SUMMARY, ETC.
Summary, etc Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and scientists, where AFM investigations are leading directly to improved processes and products. This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to practising engineers, those who are improving their AFM skills and knowledge, and researchers who are developing new products and solutions using AFM. The book takes a rigorous but practical approach to ensure that it is also directly applicable to practical process engineering problems. Fundamentals of the techniques are concisely described and specific benefits for process engineering clearly defined and illustrated. Coverage of applications of AFM to important areas of process engineering is comprehensive. Each of the chapter authors are recognized authorities on their subject.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Atomic force microscopy.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Production engineering.
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element TECHNOLOGY & ENGINEERING
General subdivision Nanotechnology & MEMS.
Source of heading or term bisacsh
655 #4 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
655 #7 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
Source of term local
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Bowen, W. Richard.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Hilal, Nidal.
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Print version:
Title Atomic force microscopy in process engineering.
Edition 1st ed.
Place, publisher, and date of publication Oxford ; Burlington, MA : Butterworth-Heinemann, c2009
International Standard Book Number 9781856175173
Record control number (OCoLC)311788904
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Butterworth-Heinemann/IChemE series.
856 40 - ELECTRONIC LOCATION AND ACCESS
Materials specified ScienceDirect
Uniform Resource Identifier http://www.sciencedirect.com/science/book/9781856175173
938 ## -
-- EBL - Ebook Library
-- EBLB
-- EBL452872
938 ## -
-- Baker and Taylor
-- BTCP
-- BK0008216470
938 ## -
-- EBSCOhost
-- EBSC
-- 249345
938 ## -
-- Coutts Information Services
-- COUT
-- 10799380
938 ## -
-- Ingram Digital eBook Collection
-- IDEB
-- 228880
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type E-Books
994 ## -
-- 92
-- NITR

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