Integrated Circuit Test Engineering (Record no. 2198)

000 -LEADER
fixed length control field 04389nam a22005415i 4500
001 - CONTROL NUMBER
control field 978-1-84628-173-0
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20141014113455.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100301s2006 xxk| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781846281730
-- 978-1-84628-173-0
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/1-84628-173-3
Source of number or code doi
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7888.4
072 #7 - SUBJECT CATEGORY CODE
Subject category code TJFC
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC008010
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Grout, Ian A.
Relator term author.
245 10 - TITLE STATEMENT
Title Integrated Circuit Test Engineering
Medium [electronic resource] :
Remainder of title Modern Techniques /
Statement of responsibility, etc by Ian A. Grout.
260 #1 - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc London :
Name of publisher, distributor, etc Springer London,
Date of publication, distribution, etc 2006.
264 #1 -
-- London :
-- Springer London,
-- 2006.
300 ## - PHYSICAL DESCRIPTION
Extent XXX, 362 p.
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note to Integrated Circuit Test Engineering -- Fabrication Processes for Integrated Circuits -- Digital Logic Test -- Memory Test -- Analogue Test -- Mixed-Signal Test -- Input-Output Test -- Design for Testability — Structured Test Approaches -- System on a Chip (SoC) Test -- Test Pattern Generation and Fault Simulation -- Automatic Test Equipment (ATE) and Production Test -- Test Economics.
520 ## - SUMMARY, ETC.
Summary, etc Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test engineering activities during development and production. Test engineering must also be more closely interwoven with microelectronic design. An understanding of circuit test engineering is vital to any student desiring a career involving any stage in the design or manufacture of integrated circuits. Taking a three-pronged approach – dealing with test engineering from traditional-test, design and manufacturing view-points – Integrated Circuit Test Engineering encapsulates the subject as it stands today. After an introduction covering background from basic testing rules to trends in technology, the reader learns about: • fabrication processes; • a diverse and complete range of detailed tests and procedures calculated to teach you all the tests you will require and how to choose which one(s) to use; • how to design for testability; • fault simulation; • automatic test equipment and • the economics of testing. From a practical perspective, the text includes: • A range of worked examples and exercises together with well-organized references and bibliography to aid further enquiry. • An introduction to various software such as MATLAB® and Spice explaining their use in testing together with that of IEEE-standard hardware-description languages Verilog®-HDL and VHDL. • A series of experiments based on material which can be freely downloaded from springeronline.com instructing you in the construction of a hardware test arrangement for MS Windows PCs (functionality, schematic and printed-circuit-board layout)with Visual Basic programs to drive the experiments. Integrated Circuit Test Engineering provides a thorough-going and illuminating introduction to test engineering in analogue, digital and mixed-signal integrated circuits. This text is a valuable practical learning tool for advanced undergraduate and graduate electronic engineering students, an excellent teaching resource for their tutors and a useful guide for the practising electronic engineer.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Computer hardware.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Computer system performance.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Industrial engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronics.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Systems engineering.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronics and Microelectronics, Instrumentation.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Computer Hardware.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element System Performance and Evaluation.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Industrial and Production Engineering.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9781846280238
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/1-84628-173-3
912 ## -
-- ZDB-2-ENG
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type E-Books

No items available.


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