Radiation Effects on Embedded Systems (Record no. 1172)

000 -LEADER
fixed length control field 03070nam a22005535i 4500
001 - CONTROL NUMBER
control field 978-1-4020-5646-8
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20141014113439.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100301s2007 ne | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781402056468
-- 978-1-4020-5646-8
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-1-4020-5646-8
Source of number or code doi
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7888.4
072 #7 - SUBJECT CATEGORY CODE
Subject category code TJFC
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC008010
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name VELAZCO, RAOUL.
Relator term editor.
245 10 - TITLE STATEMENT
Title Radiation Effects on Embedded Systems
Medium [electronic resource] /
Statement of responsibility, etc edited by RAOUL VELAZCO, PASCAL FOUILLAT, RICARDO REIS.
260 #1 - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc Dordrecht :
Name of publisher, distributor, etc Springer Netherlands,
Date of publication, distribution, etc 2007.
264 #1 -
-- Dordrecht :
-- Springer Netherlands,
-- 2007.
300 ## - PHYSICAL DESCRIPTION
Extent VIII, 269 p.
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Radiation Space Environment -- Radiation Effects in Microelectronics -- In-flight Anomalies on Electronic Devices -- Multi-level Fault Effects Evaluation -- Effects of Radiation on Analog and Mixed-Signal Circuits -- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing -- Design Hardening Methodologies for ASICs -- Fault Tolerance in Programmable Circuits -- Automatic Tools for Design Hardening -- Test Facilities for SEE and Dose Testing -- Error Rate Prediction of Digital Architectures: Test Methodology and Tools -- Using the SEEM Software for Laser SET Testing and Analysis.
520 ## - SUMMARY, ETC.
Summary, etc Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005. This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronics.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Systems engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nuclear engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Environmental protection.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Effects of Radiation/Radiation Protection.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronic and Computer Engineering.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronics and Microelectronics, Instrumentation.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nuclear Engineering.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name FOUILLAT, PASCAL.
Relator term editor.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name REIS, RICARDO.
Relator term editor.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9781402056451
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-1-4020-5646-8
912 ## -
-- ZDB-2-ENG
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type E-Books

No items available.


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