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1.
Lock-in Thermography [electronic resource] : Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.

by Breitenstein, Otwin [author.] | Warta, Wilhelm [author.] | Langenkamp, Martin [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010Online access: Click here to access online Availability: No items available :

2.
Poly-SiGe for MEMS-above-CMOS Sensors [electronic resource] / by Pilar Gonzalez Ruiz, Kristin De Meyer, Ann Witvrouw.

by Gonzalez Ruiz, Pilar [author.] | De Meyer, Kristin [author.] | Witvrouw, Ann [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: Text Text; Format: electronic available online remote; Literary form: Not fiction Language: English Publisher: Dordrecht : Springer Netherlands : Imprint: Springer, 2014Online access: Click here to access online Availability: No items available :



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