Nanoscale characterisation of ferroelectronic materials: scanning probe microscopy approach

By: Alexe, M.(Ed.)Material type: TextTextLanguage: English Series: NANOCSCIENCE AND TECHNOLOGYPublisher: Berlin : Springer, 2004Description: 282ISBN: 9783540206620Subject(s): Nanotechnology | Nanostructured materials | Magnetism | Materials | Physics | EngineeringDDC classification: 620.5
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