Dynamic Characterisation of Analogue-to-Digital Converters [electronic resource] / by Dominique Dallet, José Machado Silva.Material type: TextLanguage: English Series: The International Series in Engineering and Computer Science, Analog Circuits and Signal Processing: 860Publisher: Boston, MA : Springer US, 2005Description: XX, 280 p. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9780387259031Subject(s): Engineering | Weights and measures | Engineering design | Microwaves | Electronics | Systems engineering | Engineering | Circuits and Systems | Electronic and Computer Engineering | Engineering Design | Electronics and Microelectronics, Instrumentation | Microwaves, RF and Optical Engineering | Measurement Science, InstrumentationAdditional physical formats: Printed edition:: No titleDDC classification: 621.3815 LOC classification: TK7888.4Online resources: Click here to access online
ADC Characterisation Based on Sinewave Analysis -- ADC Applications, Architectures and Terminology -- Sinewave Test Setup -- Time-Domain Data Analysis -- Frequency-Domain Data Analysis -- Code Histogram Test -- Comparative Study of ADC Sinewave Test Methods -- Measurement of Additional Parameters -- Jitter Measurement -- Differential Gain and Phase Testing -- Step and Transient Response Measurement -- Hysteresis Measurement.
The Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for system’s performance and flexibility. Knowing accurately all the parameters that characterise their dynamic behaviour is crucial, on one hand to select the most adequate ADC architecture and characteristics for each end application, and on the other hand, to understand how they affect performance bottlenecks in the signal processing chain. Dynamic Characterisation of Analogue-to-Digital Converters presents a state of the art overview of the methods and procedures employed for characterising ADCs’ dynamic performance behaviour using sinusoidal stimuli. The three classical methods – histogram, sine wave fitting, and spectral analysis – are thoroughly described, and new approaches are proposed to circumvent some of their limitations. This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the most important and critical details for their implementation.