Normal view MARC view ISBD view

X-ray microscopy and spectromicroscoy

By: Thieme, Jurgen.
Material type: materialTypeLabelBookPublisher: Berlin : Springer verlag, 1998Description: VARIOUS PA.ISBN: 3540639985.DDC classification: 502.82
List(s) this item appears in: List of CDs Available with Books
Tags from this library: No tags from this library for this title. Log in to add tags.
    average rating: 0.0 (0 votes)
Item type Current location Call number Status Date due Barcode
Reference Reference Reference Section 502.82 THI/X (Browse shelf) Not for loan 48997

There are no comments for this item.

Log in to your account to post a comment.

Implemented and Maintained by Biju Patnaik Central Library.
For any Suggestions/Query Contact to library or Email: OR Ph:91+6612462103
Website/OPAC best viewed in Mozilla Browser in 1366X768 Resolution.

Powered by Koha