Lock-in Thermography [electronic resource] : Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.Material type: TextLanguage: English Series: Springer Series in Advanced Microelectronics: 10Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010Description: X, 258 p. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9783642024177Subject(s): Physics | Engineering | Materials | Surfaces (Physics) | Physics | Optics, Optoelectronics, Plasmonics and Optical Devices | Characterization and Evaluation of Materials | Engineering, general | Structural MaterialsAdditional physical formats: Printed edition:: No titleDDC classification: 621.36 LOC classification: QC350-467TA1501-1820QC392-449.5TA1750-1750.22Online resources: Click here to access online
Introduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.