Fringe 2005 [electronic resource] : The 5th International Workshop on Automatic Processing of Fringe Patterns / edited by Wolfgang Osten.Material type: TextLanguage: English Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006Description: XVIII, 714 p. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9783540293033Subject(s): Engineering | Physical optics | Machinery | System safety | Engineering | Quality Control, Reliability, Safety and Risk | Manufacturing, Machines, Tools | Applied Optics, Optoelectronics, Optical Devices | Control Engineering | Automation and RoboticsAdditional physical formats: Printed edition:: No titleDDC classification: 658.56 LOC classification: TA169.7T55-T55.3TA403.6Online resources: Click here to access online
Key Note -- New Methods and Tools for Data Processing -- Resolution Enhanced Technologies -- Wide Scale 4D Optical Metrology -- Hybrid Measurement Technologies -- New Optical Sensors and Measurement Systems.
The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moiré and Grid Techniques for Stress Analysis, Nondestructive Testing, Shape Measurement, Fault Detection, Quality Control and related fields. Topics of particular interest are: Advanced Computer Aided Measurement Techniques; Resolution Enhanced Technologies in Optical Metrology; New approaches in Wide Scale 4D Optical Metrology; Sophisticated Sensors Systems and their applications for the solution of challenging measurement problems. Special emphasis is put on modern Measurement Strategies taking into account the active combination of Physical Modeling, Computer Aided Simulation and Experimental Data Acquisition. Further attention is directed to new approaches for the Extension of Existing Resolution Limits that open the gates to Wide Scale Metrology ranging from nano to macro by using Advanced Optical Sensor Systems.